High pressure direct synthesis of III-V nitrides

被引:19
|
作者
Bockowski, M [1 ]
机构
[1] High Pressure Res Ctr, PL-01142 Warsaw, Poland
关键词
AlN; GaN; InN; combustion synthesis; crystal growth;
D O I
10.1016/S0921-4526(98)01300-3
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The nitrides of group III metals: (AIN, GaN, InN) are very important materials due to their applications for short wavelength optoelectronics (light-emitting diodes and laser diodes). In this paper, the results of high-pressure direct synthesis of AIN, GaN and InN are presented. The conditions for the thermodynamical stability for AIN, GaN and InN are discussed. The influence of the kinetic barrier on the synthesis of InN, GaN and AIN is considered using the results of quantum mechanical calculations of the dissociative adsorption of N-2 on the liquid metal surface. It is shown that the kinetic barrier for InN synthesis is very high, preventing direct synthesis of this compound. This barrier is lower for GaN, which allows to grow GaN crystals from the solution of atomic nitrogen in liquid gallium. The lowest barrier is for AlN, which leads to the combustion reaction of liquid aluminum in nitrogen atmosphere, in the pressure range from 10 to 650 MPa. At higher pressure, the extinction of combustion synthesis takes place. (C) 1999 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1 / 5
页数:5
相关论文
共 50 条
  • [41] Fabrication of LEDs based on III-V nitrides and their applications
    Shibata, N
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2002, 192 (02): : 254 - 260
  • [42] III-V nitrides - important future electronic materials
    Monemar, B
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1999, 10 (04) : 227 - 254
  • [43] Special issue on III-V nitrides and silicon carbide
    Capano, MA
    Mohney, S
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (05) : 383 - 383
  • [44] The incorporation of hydrogen into III-V nitrides during processing
    Pearton, SJ
    Shul, RJ
    Wilson, RG
    Ren, F
    Zavada, JM
    Abernathy, CR
    Vartuli, CB
    Lee, JW
    Mileham, JR
    Mackenzie, JD
    JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (05) : 845 - 849
  • [45] Ion implantation and annealing studies in III-V nitrides
    Zolper, JC
    Pearton, SJ
    Williams, JS
    Tan, HH
    Karlicek, RJ
    Stall, RA
    III-V NITRIDES, 1997, 449 : 981 - 991
  • [46] Comparison of plasma etch techniques for III-V nitrides
    Shul, RJ
    Vawter, GA
    Willison, CG
    Bridges, MM
    Lee, JW
    Pearton, SJ
    Abernathy, CR
    SOLID-STATE ELECTRONICS, 1998, 42 (12) : 2259 - 2267
  • [47] Structural defects and materials performance of the III-V nitrides
    Ponce, FA
    GROUP III NITRIDE SEMICONDUCTOR COMPOUNDS: PHYSICS AND APPLICATIONS, 1998, 6 : 123 - 157
  • [48] III-V nitrides: wurtzite symmetry and optical absorption
    Bigenwald, P
    Christol, P
    Konczewicz, L
    Testud, P
    Gil, B
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 50 (1-3): : 208 - 211
  • [49] Swift heavy ions effects in III-V nitrides
    Mansouri, S.
    Marie, P.
    Dufour, C.
    Nouet, G.
    Monnet, I.
    Lebius, H.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (12-13): : 2814 - 2818
  • [50] III-V nitrides—important future electronic materials
    B. Monemar
    Journal of Materials Science: Materials in Electronics, 1999, 10 : 227 - 254