Distance displacement measurement with two-photon absorption process in Si-APD and high-speed optical millimeter wave scanner

被引：0
|
作者：
Tanaka, Yosuke [1 ]
Meguro, Daichi [1 ]
Endo, Naofumi [1 ]
Kurokawa, Takashi [1 ]
机构：
[1] Tokyo Univ Agr & Technol, Div Adv Elect & Elect Engn, Grad Sch Engn, Koganei, Tokyo 1848588, Japan
来源：
21ST INTERNATIONAL CONFERENCE ON OPTICAL FIBER SENSORS | 2011年 / 7753卷
关键词：
Distance displacement measurement; two-photon absorption; optical millimeter wave;
D O I：
10.1117/12.885969
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A high-speed optical millimeter wave scanner has been developed and introduced into the distance displacement measurement based on two-photon absorption (TPA) process in a Si-APD. The TPA-based distance displacement measurement can measure the displacement of an object at 10 mm to 10 km away in principle. The measurement for the long distance of 10 m to 10 km was already realized by using intensity modulated light with a modulation frequency range of 10 GHz in the last study. The high-speed optical millimeter wave scanner developed in this study scanned over 100 GHz in 10 ms at its highest speed. We have successfully measured the short distance of 10 mm with a data acquisition time of 1 s and an accuracy of 6.34x10(-3).
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页数：4
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  • [22] Two-Photon Absorption Effect on Pseudorandom Bit Sequence for High-Speed Operation
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  • [24] Resolution and noise factor of distance measurement using two-photon absorption process in photodetector
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    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (8A): : 5331 - 5337
  • [25] Optical signal processing via two-photon absorption in a semiconductor microcavity for the next generation of high-speed optical communications network
    Maguire, P. J.
    Barry, L. P.
    Krug, T.
    Guo, W. H.
    O'Dowd, J.
    Lynch, M.
    Bradley, A. L.
    Donegan, J. F.
    Folliot, H.
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2006, 24 (07) : 2683 - 2692
  • [26] Characterization of two-photon photopolymerization fabrication using high-speed optical diffraction tomography
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  • [27] Simulation of all-optical demultiplexing utilizing two-photon absorption in semiconductor devices for high-speed OTDM networks
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    Barry, LP
    [J]. 2004 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2004, : 975 - 976
  • [28] Dispersion monitoring for high-speed WDM networks via two-photon absorption in a semiconductor microcavity
    Maguire, P. J.
    Bondarczuk, K.
    Barry, L. P.
    O'Dowd, J.
    Guo, W. H.
    Lynch, M.
    Bradley, A. L.
    Donegan, J. F.
    Folliot, H.
    [J]. ICTON 2006: 8TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 4, PROCEEDINGS: CONFERENCE & COST P 11 TRAINING SCHOOL POSTERS, 2006, : 138 - +
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    O'Dowd, J.
    Guo, W. H.
    Lynch, M.
    Bradley, A. L.
    Donegan, J. F.
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2009, 45 (03) : 223 - 232
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    Guo, W. H.
    Lynch, M.
    Bradley, A. L.
    Donegan, J. F.
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2009, 45 (1-2) : 90 - 99
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