Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors

被引：11

作者：

Heijne, E. H. M. ^{[1
,2
,3
]}

Ballabriga, R. ^{[1
]}

Boltje, D. ^{[3
]}

Campbell, M. ^{[1
]}

Idarraga, J. ^{[4
]}

Jakubek, J. ^{[2
]}

Leroy, C. ^{[4
]}

Llopart, X. ^{[1
]}

Tlustos, L. ^{[1
]}

Plackett, R. ^{[1
]}

Pospisil, S. ^{[2
]}

Turecek, D. ^{[2
]}

Vermeulen, J. ^{[3
]}

Visschers, J. ^{[3
]}

Visser, J. ^{[3
]}

Vykydal, Z. ^{[2
]}

Wong, W. ^{[1
]}

机构：

[1] CERN, PH Dept, CH-1211 Geneva 23, Switzerland

[2] Czech Tech Univ, IEAP, CZ-12800 Prague, Czech Republic

[3] NIKHEF H, NL-1098 XG Amsterdam, Netherlands

[4] Univ Montreal, Lab Rene JA Levesque, Montreal, PQ H3C 3J7, Canada

来源：

JOURNAL OF INSTRUMENTATION | 2010年 / 5卷

关键词：

Particle tracking detectors; Detector design and construction technologies and materials; dE/dx detectors; Pattern recognition; cluster finding; calibration and fitting methods;

D O I：

10.1088/1748-0221/5/06/C06004

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Measurements are shown of GeV pions and muons in two 300 mu m thick, Si Medipix pixel detector assemblies that are stacked on top of each other, with a 25 mu m thick brass foil in between. In such a radiation imaging semiconductor matrix with a large number of pixels along the particle trail, one can determine local space vectors for the particle trajectory instead of points. This improves pattern recognition and track reconstruction, especially in a crowded environment. Stacking of sensor planes is essential for resolving directional ambiguities. Signal charge sharing can be employed for measuring positions with submicron precision. In the measurements one notices accompanying 'delta' electrons that emerge outside the particle trail, far beyond the boundaries of the 55 mu m pixel cells. The frequency of such corrupted position measurements is similar to one per 2.5mm of traversed Si.

引用

页数：7

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