InGaAsP lasers on GaAs fabricated by the surface activated wafer direct bonding method at room temperature

被引:8
|
作者
Chung, T
Hosoda, N
Suga, T
Takagi, H
机构
[1] Univ Tokyo, RCAST, Meguro Ku, Tokyo 153, Japan
[2] MITI, Agcy Ind Sci & Technol, Mech Engn Lab, Tsukuba, Ibaraki 305, Japan
关键词
surface activated bonding; optoelectronic integrated circuit; optical communication; optical interconnection; monolithic; room temperature; wafer bonding;
D O I
10.1143/JJAP.37.1405
中图分类号
O59 [应用物理学];
学科分类号
摘要
1.3 mu m InGaAsP/lnP strained-layer quantum wells ridge waveguide lasers have been successfully fabricated on a GaAs substrate by the surface activated wafer direct bonding method at room temperature. In this method, the surfaces of two wafers are activated by Ar fast atom beam irradiation and mated in a high vacuum. A high bonding strength was attained. No microcracks and voids were found under transmission electron microscopy(TEM). A threshold current density of 500 A/cm(2) was achieved. This technique is very promising to realize a monolithic of optoelectronic integrated circuits for optical communications and interconnections.
引用
收藏
页码:1405 / 1407
页数:3
相关论文
共 50 条
  • [31] Photo-pumped operation of InGaAsP vertical-cavity lasers on Si fabricated by wafer bonding
    Wada, H
    Takamori, T
    Kamijoh, T
    [J]. 1997 INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS - CONFERENCE PROCEEDINGS, 1997, : 40 - 43
  • [32] 1.3-mu m InP-InGaAsP lasers fabricated on Si substrates by wafer bonding
    Wada, H
    Kamijoh, T
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1997, 3 (03) : 937 - 942
  • [33] Combined surface-activated bonding technique for low-temperature hydrophilic direct wafer bonding
    He, Ran
    Fujino, Masahisa
    Yamauchi, Akira
    Suga, Tadatomo
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (04)
  • [34] Surface activated bonding of GaAs and SiC wafers at room temperature for improved heat dissipation in high-power semiconductor lasers
    Higurashi, Eiji
    Okumura, Ken
    Nakasuji, Kaori
    Suga, Tadatomo
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2015, 54 (03)
  • [35] Room temperature vacuum sealing using surface activated bonding method
    Itoh, T
    Okada, H
    Takagi, H
    Maeda, R
    Suga, T
    [J]. BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2003, : 1828 - 1831
  • [36] Room temperature wafer bonding by surface activated ALD-Al2O3
    Li, Yun
    Wang, Shengkai
    Sun, Bing
    Chang, Hudong
    Zhao, Wei
    Zhang, Xiong
    Liu, Honggang
    [J]. SEMICONDUCTOR WAFER BONDING 12: SCIENCE, TECHNOLOGY, AND APPLICATIONS, 2012, 50 (07): : 303 - 311
  • [37] Low temperature Si/Si wafer direct bonding using a plasma activated method
    Li, Dong-ling
    Shang, Zheng-guo
    Wang, Sheng-qiang
    Wen, Zhi-yu
    [J]. JOURNAL OF ZHEJIANG UNIVERSITY-SCIENCE C-COMPUTERS & ELECTRONICS, 2013, 14 (04): : 244 - 251
  • [38] Low temperature Si/Si wafer direct bonding using a plasma activated method
    Dong-ling LI
    Zheng-guo SHANG
    Sheng-qiang WANG
    Zhi-yu WEN
    [J]. Frontiers of Information Technology & Electronic Engineering, 2013, 14 (04) : 244 - 251
  • [39] Low temperature Si/Si wafer direct bonding using a plasma activated method
    Dong-ling Li
    Zheng-guo Shang
    Sheng-qiang Wang
    Zhi-yu Wen
    [J]. Journal of Zhejiang University SCIENCE C, 2013, 14 : 244 - 251
  • [40] High-Temperature 1.3 μm InAs/GaAs Quantum Dot Lasers on Si Substrates Fabricated by Wafer Bonding
    Tanabe, Katsuaki
    Rae, Timothy
    Watanabe, Katsuyuki
    Arakawa, Yasuhiko
    [J]. APPLIED PHYSICS EXPRESS, 2013, 6 (08)