InGaAsP lasers on GaAs fabricated by the surface activated wafer direct bonding method at room temperature

被引:8
|
作者
Chung, T
Hosoda, N
Suga, T
Takagi, H
机构
[1] Univ Tokyo, RCAST, Meguro Ku, Tokyo 153, Japan
[2] MITI, Agcy Ind Sci & Technol, Mech Engn Lab, Tsukuba, Ibaraki 305, Japan
关键词
surface activated bonding; optoelectronic integrated circuit; optical communication; optical interconnection; monolithic; room temperature; wafer bonding;
D O I
10.1143/JJAP.37.1405
中图分类号
O59 [应用物理学];
学科分类号
摘要
1.3 mu m InGaAsP/lnP strained-layer quantum wells ridge waveguide lasers have been successfully fabricated on a GaAs substrate by the surface activated wafer direct bonding method at room temperature. In this method, the surfaces of two wafers are activated by Ar fast atom beam irradiation and mated in a high vacuum. A high bonding strength was attained. No microcracks and voids were found under transmission electron microscopy(TEM). A threshold current density of 500 A/cm(2) was achieved. This technique is very promising to realize a monolithic of optoelectronic integrated circuits for optical communications and interconnections.
引用
收藏
页码:1405 / 1407
页数:3
相关论文
共 50 条
  • [1] 1.3 μm InGaAsP/InP lasers on GaAs substrate fabricated by the surface activated wafer bonding method at room temperature
    Chung, TR
    Hosoda, N
    Suga, T
    Takagi, H
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (13) : 1565 - 1566
  • [2] Room-temperature CW operation of InGaAsP lasers on Si fabricated by wafer bonding
    Wada, H
    Kamijoh, T
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1996, 8 (02) : 173 - 175
  • [3] Room temperature GaAs-Si and InP-Si wafer direct bonding by the surface activated bonding method
    Chung, TR
    Yang, L
    Hosoda, N
    Suga, T
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 121 (1-4): : 203 - 206
  • [4] Wafer direct bonding of compound semiconductors and silicon at room temperature by the surface activated bonding method
    Chung, TR
    Yang, L
    Hosoda, N
    Takagi, H
    Suga, T
    [J]. APPLIED SURFACE SCIENCE, 1997, 117 : 808 - 812
  • [5] Room Temperature Wafer Bonding Using Surface Activated Bonding Method
    Taniyama, Shingo
    Wang, Ying-Hui
    Fujino, Masahisa
    Suga, Tadatomo
    [J]. IEEE 9TH VLSI PACKAGING WORKSHOP IN JAPAN, 2008, : 141 - 144
  • [6] SOI wafer fabricated with a diamond BOX layer using surface activated bonding at room temperature
    Koga, Yoshihiro
    Kurita, Kazunari
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2019, 58 (01)
  • [7] Room Temperature Bonding of Polymer to Glass Wafer using Surface Activated Bonding (SAB) Method
    Matsumae, T.
    Nakano, M.
    Matsumoto, Y.
    Suga, T.
    [J]. SEMICONDUCTOR WAFER BONDING 12: SCIENCE, TECHNOLOGY, AND APPLICATIONS, 2012, 50 (07): : 297 - 302
  • [8] Intrinsic microstructure of Si/GaAs heterointerfaces fabricated by surface-activated bonding at room temperature
    Ohno, Yutaka
    Yoshida, Hideto
    Takeda, Seiji
    Liang, Jianbo
    Shigekawa, Naoteru
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (02)
  • [9] Room-temperature direct bonding of germanium wafers by surface-activated bonding method
    Higurashi, Eiji
    Sasaki, Yuta
    Kurayama, Ryuji
    Suga, Tadatomo
    Doi, Yasuo
    Sawayama, Yoshihiro
    Hosako, Iwao
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2015, 54 (03)
  • [10] Room temperature Cu-Cu direct bonding using surface activated bonding method
    Kim, TH
    Howlader, MMR
    Itoh, T
    Suga, T
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (02): : 449 - 453