Monte Carlo simulation of ion-induced kinetic electron emission from a metal surface

被引:1
|
作者
Kawata, J
Ohya, K
机构
[1] UNIV TOKUSHIMA, FAC ENGN, TOKUSHIMA 770, JAPAN
[2] TAKUMA NATL COLL TECHNOL, DEPT INFORMAT ENGN, TAKUMA, KAGAWA 76911, JAPAN
关键词
D O I
10.1016/0169-4332(96)00237-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Proton-induced kinetic electron emission from beryllium is studied using a Monte Carlo simulation. The emphasis is put on the effects of roughness and work function of the surface on the energy and angular distributions of emitted electrons as well as the electron yield. For small aspect ratio H/W of the bowl-structured surface, emission of low-energy cascade electrons from an inclined plane causes an increase in the electron yield, whereas, for large H/W, re-entrance of emitted electrons causes a decrease in the yield and the number of electrons emitted with oblique angles; where H and W are the depth and width of the structure. The dominant emission of low-energy cascade electrons causes a significant increase in the electron yield with low work function, whereas, with high work function, the high-energy component, as well as the low-energy one, is decreased.
引用
收藏
页码:338 / 341
页数:4
相关论文
共 50 条
  • [42] A SEMIEMPIRICAL CALCULATION OF ION-INDUCED KINETIC ELECTRON-EMISSION STATISTICS
    OHYA, K
    MORI, I
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (11): : 3686 - 3687
  • [43] ION-INDUCED ELECTRON-EMISSION FROM METAL-SURFACES - INSIGHTS FROM THE EMISSION STATISTICS
    TOGLHOFER, K
    AUMAYR, F
    WINTER, HP
    SURFACE SCIENCE, 1993, 281 (1-2) : 143 - 152
  • [44] ION-INDUCED ELECTRON-EMISSION FROM SOLIDS
    HOFER, WO
    SCANNING MICROSCOPY, 1990, : 265 - 310
  • [45] ION-INDUCED ELECTRON-EMISSION FROM CARBON
    HASSELKAMP, D
    SCHARMANN, A
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : K197 - K200
  • [46] Fermi edge singularities in ion-induced electron emission from plane metal surfaces
    Sindona, A.
    Rudi, S. A.
    Maletta, S.
    Baragiola, R. A.
    Falcone, G.
    Riccardi, P.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 257 (438-441): : 438 - 441
  • [47] Monte Carlo simulation study of secondary electron emission and surface excitation
    Ding, ZJ
    Shimizu, R
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165): : 279 - 280
  • [48] CALCULATION OF INCIDENT ANGLE DEPENDENCE OF ION-INDUCED KINETIC ELECTRON-EMISSION FROM ALUMINUM
    KAWATA, J
    OHYA, K
    MORI, I
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (08): : 2560 - 2564
  • [49] STUDY OF THE ION-INDUCED ELECTRON-EMISSION FROM THE SURFACE OF A SINGLE-CRYSTAL
    BRUSILOVSKY, BA
    VACUUM, 1991, 42 (18) : 1183 - 1186
  • [50] Z1-OSCILLATIONS IN ION-INDUCED KINETIC ELECTRON-EMISSION
    THUM, F
    HOFER, WO
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 531 - 535