Interfacial reactions between Sn-Cu based multicomponent solders and ni substrates during soldering and aging

被引:0
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作者
Zhao, Ning [1 ]
Ma, Hai-tao [1 ]
Wang, Lai [1 ]
机构
[1] Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The interfacial reactions between two Sn-Cu based multicomponent Pb-free solders, Sn-2Cu-0.5Ni and Sn-2Cu-0.5Ni-0.5Au (wt%), and Ni substrates during soldering and aging were investigated. Differential scanning calorimetry (DSC) was performed to measure the melting behaviors of the solders and determine the temperature of soldering. DSC tests show that the onset temperatures are 227.47 degrees C and 224.78 degrees C for Sn-2Cu-0.5Ni and Sn-2Cu-0.5Ni-0.5Au, respectively. Two intermetallic compounds (IMCs), Cu6Sn5 and (Cu,Ni)(6)Sn-5, are formed in Sn-2Cu-0.5Ni solder. While the IMCs detected in Sn-2Cu-0.5Ni-0.5Au matrix are (Cu,Ni)(6)Sn-5, (Cu,Au)(6)Sn-5 and (Cu,Ni,Au)(6)Sn-5. The IMC layer formed at both the solder/Ni interfaces is (Cu,Ni)(6)Sn-5 with stick-lick morphology after soldering at 260 degrees C. The interfacial IMC layers become planar when aged at 170 degrees C for 500 h. However, cracks are found in the IMC layers at both joints when the aging time reaches 1000 h, which implies reliability problem may exist in the joints. Moreover, Au-containing IMCs are found on the top of the IMC layer in Sn-2Cu-0.5Ni-0.5Au/Ni joint after aging for 1000 h.
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页码:222 / +
页数:2
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