Off-stoichiometry effects on BiFeO3 thin films

被引：81
|
作者：
Lahmar, A. [1 ,2 ]
Zhao, K. [1 ]
Habouti, S. [1 ]
Dietze, M. [1 ]
Solterbeck, C. -H. [1 ]
Es-Souni, M. [1 ]
机构：
[1] Univ Appl Sci, Inst Mat & Surface Technol, Kiel, Germany
[2] Univ La Rochelle, LEACIM, F-17042 La Rochelle 01, France
来源：
SOLID STATE IONICS | 2011年 / 202卷 / 01期
关键词：
Bismuth ferrite; Phase diagram; Defect structure; Ferroelectric properties; Magnetic properties; FERROELECTRIC PROPERTIES; NEUTRON-DIFFRACTION; SYSTEM;
D O I：
10.1016/j.ssi.2011.03.017
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The effects of Bi and Fe-excess on the structure, ferroelectric, leakage current and magnetic properties of BiFeO3 (BFO) thin films are reported. BFO with 5% excess exhibits no change in the structure with an improvement in leakage current properties in comparison to stoichiometric BFO. Raman spectroscopy of 10% Bi excess suggests a structural change from monoclinic to rhombohedral accompanied with an improvement of resistivity and ferroelectric polarization switching. A higher Fe-excess leads to the formation of pyrochlore Bi2Fe4O9 and gamma-Fe2O3 that cause an increase in conductivity at the macroscopic scale. The results are discussed in terms of Fe and Bi-excess effects on the defect structure of BFO. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码：1 / 5
页数：5
相关论文
共 50 条
  • [1] Off-stoichiometry indexation of BiFeO3 thin film on silicon by Rutherford backscattering spectrometry
    王泽松
    肖仁政
    邹长伟
    谢伟
    田灿鑫
    薛书文
    刘贵昂
    Neena Devi
    付德君
    Chinese Physics B, 2018, (04) : 507 - 512
  • [2] Off-stoichiometry indexation of BiFeO3 thin film on silicon by Rutherford backscattering spectrometry
    Wang, Ze-Song
    Xiao, Ren-Zheng
    Zou, Chang-Wei
    Xie, Wei
    Tian, Can-Xin
    Xue, Shu-Wen
    Liu, Gui-Ang
    Devi, Neena
    Fu, De-Jun
    CHINESE PHYSICS B, 2018, 27 (04)
  • [3] Control of the Cation Stoichiometry in the Multiferroic BiFeO3 Thin Films
    Kartavtseva, M. S.
    Gorbenko, O. Yu.
    Kaul, A. R.
    Fusil, S.
    Barthelemy, A.
    Bouzehouane, K.
    FERROELECTRICS, 2008, 374 : 164 - 169
  • [4] BiFeO3 thin films:: Novel effects
    Palkar, VR
    Pinto, R
    PRAMANA-JOURNAL OF PHYSICS, 2002, 58 (5-6): : 1003 - 1008
  • [5] BiFeO3 thin films: Novel effects
    V R Palkar
    R Pinto
    Pramana, 2002, 58 : 1003 - 1008
  • [6] Oxygen off-stoichiometry and phase separation in EuO thin films
    Altendorf, S. G.
    Efimenko, A.
    Oliana, V.
    Kierspel, H.
    Rata, A. D.
    Tjeng, L. H.
    PHYSICAL REVIEW B, 2011, 84 (15):
  • [7] Off-Stoichiometry of Magnetron Sputtered Ba1-xSrxTiO3 Thin Films
    Rachut, Karsten
    Bayer, Thorsten J. M.
    Wolff, Jan O.
    Kmet, Brigita
    Bencan, Andreja
    Klein, Andreas
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2019, 256 (10):
  • [8] Photoconductivity in BiFeO3 thin films
    Basu, S. R.
    Martin, L. W.
    Chu, Y. H.
    Gajek, M.
    Ramesh, R.
    Rai, R. C.
    Xu, X.
    Musfeldt, J. L.
    APPLIED PHYSICS LETTERS, 2008, 92 (09)
  • [9] Thermodynamics of multiferroic BiFeO3: Applications for the deposition of BiFeO3 thin films
    Mei, Zhi-Gang
    Shang, ShunLi
    Wang, Yi
    Liu, Zi-Kui
    APPLIED PHYSICS LETTERS, 2011, 98 (13)
  • [10] Ferroelectric size effects in multiferroic BiFeO3 thin films
    Chu, Y. H.
    Zhao, T.
    Cruz, M. P.
    Zhan, Q.
    Yang, P. L.
    Martin, L. W.
    Huijben, M.
    Yang, C. H.
    Zavaliche, F.
    Zheng, H.
    Ramesh, R.
    APPLIED PHYSICS LETTERS, 2007, 90 (25)
12345