Dynamic test compaction for synchronous sequential circuits using static compaction techniques

被引：17
|
作者：
Pomeranz, I [1 ]
Reddy, SM [1 ]
机构：
[1] UNIV IOWA,DEPT ELECTR & COMP ENGN,IOWA CITY,IA 52242
来源：
PROCEEDINGS OF THE TWENTY-SIXTH INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING | 1996年
关键词：
D O I：
10.1109/FTCS.1996.534594
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：53 / 61
页数：9
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