"Dislocation density measurement by electron channeling contrast imaging in a scanning electron microscope" (vol 66, pg 343, 2012)

被引：0
|
作者：
Gutierrez-Urrutia, I. [1 ]
Raabe, D. [1 ]
机构：
[1] Max Planck Inst Eisenforsch GmbH, D-40237 Dusseldorf, Germany
来源：
SCRIPTA MATERIALIA | 2012年 / 66卷 / 09期
关键词：
D O I：
10.1016/j.scriptamat.2012.02.001
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：720 / 720
页数：1
相关论文
共 50 条
  • [21] Correlation between dislocation density and pop-in phenomena in aluminum studied by nanoindentation and electron channeling contrast imaging
    Barnoush, Afrooz
    Welsch, Markus T.
    Vehoff, Horst
    SCRIPTA MATERIALIA, 2010, 63 (05) : 465 - 468
  • [22] Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
    Trager-Cowan, C.
    Alasmari, A.
    Avis, W.
    Bruckbauer, J.
    Edwards, P. R.
    Hourahine, B.
    Kraeusel, S.
    Kusch, G.
    Jablon, B. M.
    Johnston, R.
    Martin, R. W.
    Mcdermott, R.
    Naresh-Kumar, G.
    Nouf-Allehiani, M.
    Pascal, E.
    Thomson, D.
    Vespucci, S.
    Mingard, K.
    Parbrook, P. J.
    Smith, M. D.
    Enslin, J.
    Mehnke, F.
    Kneissl, M.
    Kuhn, C.
    Wernicke, T.
    Knauer, A.
    Hagedorn, S.
    Walde, S.
    Weyers, M.
    Coulon, P-M
    Shields, P. A.
    Zhang, Y.
    Jiu, L.
    Gong, Y.
    Smith, R. M.
    Wang, T.
    Winkelmann, A.
    EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 2020, 891
  • [23] EXPERIMENTAL ASPECTS OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY .1. MEASUREMENT OF CONTRAST
    YAMAMOTO, T
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 44 (01): : 137 - 146
  • [24] Charge contrast imaging of biomaterials in a variable pressure scanning electron microscope
    Clode, Peta L.
    JOURNAL OF STRUCTURAL BIOLOGY, 2006, 155 (03) : 505 - 511
  • [25] Charge contrast imaging of geological materials in the environmental scanning electron microscope
    Watt, GR
    Griffin, BJ
    Kinny, PD
    AMERICAN MINERALOGIST, 2000, 85 (11-12) : 1784 - 1794
  • [26] Contrast mechanism of negatively charged insulators in scanning electron microscope (vol 47, pg 143, 1998)
    Ura, K
    JOURNAL OF ELECTRON MICROSCOPY, 1998, 47 (03): : 277 - 277
  • [27] CONTRAST AND RESOLUTION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGING MODES
    REICHELT, R
    ENGEL, A
    ULTRAMICROSCOPY, 1986, 19 (01) : 43 - 56
  • [28] Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP
    Tsurumi, Daisuke
    Hamada, Kotaro
    Kawasaki, Yuji
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 : S183 - S187
  • [29] Analysis of dislocation configurations in a [001] fcc single crystal by electron channeling contrast imaging in the SEM
    Gutierrez-Urrutia, Ivan
    MICROSCOPY, 2017, 66 (02) : 63 - 67
  • [30] Cathodoluminescence in the scanning transmission electron microscope (vol 176, pg 112, 2017)
    Kociak, M.
    Zagonel, L. F.
    ULTRAMICROSCOPY, 2017, 174 : 50 - 50
12345