Fault diagnosis on board for analog to digital converters

被引：0
|
作者：
Ciani, Lorenzo [1 ]
Catelani, Marcantonio [1 ]
Iuculano, Gaetano [1 ]
机构：
[1] Univ Florence, DET, I-50139 Florence, Italy
来源：
2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2007年
关键词：
ADC testing; Data Acquisition; Histogram; Two tone test; Diagnosis;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper describes a general purpose high reliable data acquisition system which allows AID converter testing by histogram and two tone tests for the fault diagnosis on the same board. A reliability analysis has been carried out in order to optimize the project, the components choice and redundancy configuration. The software has been written in Matlab and LabVIEW with an easy graphical user interface.
引用
收藏
页码：626 / 629
页数：4
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