IMPACTS OF RANDOM TELEGRAPH NOISE (RTN) ON THE ENERGY DELAY TRADEOFFS OF LOGIC CIRCUITS

被引:0
|
作者
Zhang, Yang [1 ,2 ]
Jiang, Xiaobo [2 ]
Wang, Junyao [2 ]
Guo, Shaofeng [2 ]
Fang, Yichen [2 ]
Wang, Runsheng [2 ]
Luo, Mulong [3 ]
Huang, Ru [2 ]
机构
[1] Peking Univ, Shenzhen Grad Sch, Shenzhen 518055, Peoples R China
[2] Peking Univ, Inst Microelect, Beijing 100871, Peoples R China
[3] Univ Calif San Diego, Dept Comp Sci & Engn, San Diego, CA 92103 USA
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, the impacts of random telegraph noise (RTN) on delay and energy of digital logic circuits arc studied. The conventional method of extracting logic gate delay is found inaccurate due to the bias dependency of RTN amplitude. Thus an appropriate measuring strategy is proposed, based on which the impact of single RTN on circuit delay is investigated, and non-monotonous trend against trap energy level Et is found. Furthermore, the impacts of multi RTN on Energy-Delay(ED) curves are discussed. It is found that RTN is unneglectable when performing an ED optimization. Otherwise, under-design phenomenon would occur considering delay constraint, and over-design would occur considering energy constraint. This result provide helpful guidelines for circuit design.
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页数:4
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