Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy

被引：24

作者：

Plisch, MJ ^{[1
]}

Chang, JL ^{[1
]}

Silcox, J ^{[1
]}

Buhrman, RA ^{[1
]}

机构：

[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 03期

关键词：

D O I：

10.1063/1.1383569

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Analytical electron microscopy has been employed to characterize the localized physical and electronic structure of a Co/AlOx/Co magnetic tunnel junction. The tunnel barrier is amorphous alumina with an extensive conduction band tail due to disorder. Both barrier edges are Al terminated and an Al-rich layer exists at the bottom Co/AlOx interface. sp-d hybridization between interfacial Co and Al atoms is observed and it is likely that the interfacial Al is metallic. All of these features are expected to be important to the magnetoresistance behavior of the junction. (C) 2001 American Institute of Physics.

引用

页码：391 / 393

页数：3

共 50 条

[41] ATOMIC-SCALE IMAGING OF DNA USING SCANNING TUNNELING MICROSCOPY
DRISCOLL, RJ
YOUNGQUIST, MG
BALDESCHWIELER, JD
NATURE, 1990, 346 (6281) : 294 - 296
[42] Atomic-scale electrochemistry on the surface of a manganite by scanning tunneling microscopy
Vasudevan, Rama K.
Tselev, Alexander
Gianfrancesco, Anthony G.
Baddorf, Arthur P.
Kalinin, Sergei V.
APPLIED PHYSICS LETTERS, 2015, 106 (14)
[43] Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy
Stock, Taylor J. Z.
Warschkow, Oliver
Constantinou, Procopios C.
Li, Juerong
Fearn, Sarah
Crane, Eleanor
Hofmann, Emily V. S.
Koelker, Alexander
McKenzie, David R.
Schofield, Steven R.
Curson, Neil J.
ACS NANO, 2020, 14 (03) : 3316 - 3327
[44] Atomic-Scale Analysis of Polydiacetylene Nanowires by Scanning Tunneling Microscopy
Giridharagopal, Rajiv
Kelly, Kevin F.
2007 7TH IEEE CONFERENCE ON NANOTECHNOLOGY, VOL 1-3, 2007, : 1006 - 1010
[45] Process investigation of the electrochemical fabrication of Au tunnel junction with atomic-scale
Dong, Xiao-Dong
Zhang, Bai-Lin
Xia, Yong
Zhu, Guo-Yi
Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities, 2008, 29 (07): : 1424 - 1427
[46] Process investigation of the electrochemical fabrication of Au tunnel junction with atomic-scale
Dong Xiao-Dong
Zhang Bai-Lin
Xia Yong
Zhu Guo-Yi
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE, 2008, 29 (07): : 1424 - 1427
[47] Analysis of Simulated Scanning of Atomic-Scale Silicon Surface by Atomic Force Microscopy
Lin, Zone-Ching
Liu, Shih-Che
SCANNING, 2008, 30 (05) : 392 - 404
[48] MAGNETIC IMAGING OF SURFACES ON THE ATOMIC-SCALE BY SPIN-POLARIZED SCANNING-TUNNELING-MICROSCOPY
WIESENDANGER, R
JOURNAL OF APPLIED PHYSICS, 1993, 73 (10) : 5816 - 5816
[49] Transmission electron microscopy study of thermally annealed low resistance magnetic tunnel junction
Kyung, H
Lee, JH
Yoon, CS
Kim, CK
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2002, 191 (01): : 296 - 304
[50] SCANNING CATHODOLUMINESCENCE MICROSCOPY - A UNIQUE APPROACH TO ATOMIC-SCALE CHARACTERIZATION OF HETEROINTERFACES AND IMAGING OF SEMICONDUCTOR INHOMOGENEITIES
CHRISTEN, J
GRUNDMANN, M
BIMBERG, D
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04): : 2358 - 2368

← 1 2 3 4 5 →