Characterization of GaN quantum discs embedded in AlxGa1-xN nanocolumns grown by molecular beam epitaxy -: art. no. 125305

被引:114
|
作者
Ristic, J [1 ]
Calleja, E
Sánchez-García, MA
Ulloa, JM
Sánchez-Páramo, J
Calleja, JM
Jahn, U
Trampert, A
Ploog, KH
机构
[1] Univ Politecn Madrid, ETSI Telecomun, ISOM, E-28040 Madrid, Spain
[2] Univ Politecn Madrid, ETSI Telecomun, Dept Ingn Elect, E-28040 Madrid, Spain
[3] Univ Autonoma Madrid, Dept Fis Mat, E-28049 Madrid, Spain
[4] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
来源
PHYSICAL REVIEW B | 2003年 / 68卷 / 12期
关键词
D O I
10.1103/PhysRevB.68.125305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
GaN quantum discs embedded in AlGaN nanocolumns with outstanding crystal quality and very high luminescence efficiency were grown on Si(111) substrates by plasma-assisted molecular beam epitaxy under highly N-rich conditions. Nanocolumns with diameters in the range of 30-150 nm, with no traces of any extended defects, as confirmed by transmission electron microscopy, were obtained. GaN quantum discs, 2 and 4 nm thick, were grown embedded in AlGaN nanocolumns by switching on and off the Al flux during variable time spans. Strong optical emissions from GaN quantum discs, observed by photoluminescence and cathodoluminescence measurements, reveal quantum confinement effects. While Raman data indicate that the nanocolumns are fully relaxed, the quantum discs appear to be fully strained. These nanostructures have a high potential for application in efficient vertical cavity emitters.
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页数:5
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