Electron delocalization in amorphous carbon by ion implantation

被引:35
|
作者
Khan, RUA [1 ]
Carey, JD
Silva, SRP
Jones, BJ
Barklie, RC
机构
[1] Univ Surrey, Sch Elect Engn IT & Math, Surrey GU2 7XH, England
[2] Trinity Coll, Dept Phys, Dublin 2, Ireland
来源
PHYSICAL REVIEW B | 2001年 / 63卷 / 12期
关键词
D O I
10.1103/PhysRevB.63.121201
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electrical properties of amorphous carbon are governed by the high localization of the sp(2) pi states, and conventional methods of altering the sp(2) content result in macroscopic graphitization. By using ion beams we have achieved a delocalization of the pi states by introducing nanoclustering and hence improving the connectivity between existing clusters, as demonstrated by the increase in the conductivity by two orders of magnitude without modification of the band gap. At higher doses, paramagnetic relaxation-time measurements indicate that exchange effects are present. This unveils the possibility of amorphous carbon-based electronics by tailoring the ion-beam conditions, which we demonstrate in the form of a rectifying device.
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页数:4
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