MOVPE of GaN on sapphire using the alternate precursor 1,1-dimethylhydrazine

被引:2
|
作者
Bourret-Courchesne, ED
Yu, KM
Irvine, SJC
Stafford, A
Rushworth, SA
Smith, LM
Kanjolia, R
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Ctr Adv Mat, Berkeley, CA 94720 USA
[2] NE Wales Inst, Wrexham, Wales
[3] Epichem Ltd, Wirral CH62 3QF, Merseyside, England
[4] Epichem Inc, Haverhill, MA 01835 USA
关键词
dimethylhydrazine; organometallic vapor-phase epitaxy (OMVPE); gallium nitride (GaN); pyrolysis; adduct; morphology; precursor;
D O I
10.1016/S0022-0248(00)00693-X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
To date, the most successful method to grow device-quality GaN epitaxial layers by metal-organic vapor-phase epitaxy (MOVPE) uses trimethyl (or triethyl) gallium (Me3Ga/Et-3 Ga) for the Ga source and ammonia (NH3) for the N source. It is a high-temperature process with deposition temperatures typically in excess of 1000 degreesC due to the high stability of the ammonia molecule. The use of a nitrogen precursor that decomposes at lower temperature is expected to result in a more efficient process and to allow growth of alloys at a lower temperature. The liquid precursor 1,1-dimethylhydrazine (Me-2 NNH2) has been tested as such an alternative precursor. GaN epilayers have been grown successfully on c-plane sapphire using low V/III ratio. The growth parameters and the characteristics of the grown epilayers are presented. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:246 / 250
页数:5
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