Spectral effects of dual wavelength low coherence light source in white light interferometry

被引:12
|
作者
Chong, Wee Keat [1 ]
Li, Xiang [1 ]
Soh, Yeng Chai [2 ]
机构
[1] Singapore Inst Mfg Technol, Precis Measurement Grp, Singapore 638075, Singapore
[2] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
Vertical scanning interferometry; Hybrid light source; LED; Fringe contrast function; Spectral manipulation; FRINGE-PATTERN-ANALYSIS;
D O I
10.1016/j.optlaseng.2012.12.014
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The spectral property of some modern (or hybrid) low coherent light source introduces distinctive feature to the interference signal of white light interferometry. The distinctive feature is defined as discontinuities which make the fringe contrast function (which is the envelope of the interference signal) unable to be modeled as a single Gaussian function. In this paper, we investigate the spectral effect of dual wavelength low coherence light source in white light interferometry and identify the distinctive feature as the result of destructive interference within the localized window where the optical path difference (OPD) is small. By doing so, we give a theoretical explanation of the distinctive feature and demonstrate that the fringe contrast function (and the location of the distinctive feature) can be manipulated by spectrum shaping. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:651 / 655
页数:5
相关论文
共 50 条
  • [41] Harnessing spectral property of dual wavelength white LED to improve vertical scanning interferometry
    Chong, Wee Keat
    Li, Xiang
    Soh, Yeng Chai
    APPLIED OPTICS, 2013, 52 (19) : 4652 - 4662
  • [42] Multi-wavelength holographic interferometry using the white-light laser
    Uno, K
    Saruta, K
    Yoshida, N
    Suzuki, M
    Tokita, Y
    Fujii, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (10): : 6631 - 6636
  • [43] EFFECT OF NONLINEAR WAVELENGTH SCANNING TO FOURIER TRANSFORM WHITE-LIGHT INTERFEROMETRY
    Jiang, Yi
    Tang, Caijie
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2009, 51 (02) : 426 - 432
  • [44] Spectrometer wavelength calibration using spectrally resolved white-light interferometry
    Youngquist, Robert C.
    Simmons, Stephen M.
    Belanger, Andrea M.
    OPTICS LETTERS, 2010, 35 (13) : 2257 - 2259
  • [45] Fourier transform white-light interferometry based on nonlinear wavelength sampling
    Wang, Zhen
    Jiang, Yi
    Ding, Wenhui
    Gao, Ran
    OPTICAL ENGINEERING, 2013, 52 (10)
  • [46] White-light spectral interferometry with the equalization wavelength determination used to measure group velocity dispersion in optical samples
    Hlubina, P
    PHOTONICS, DEVICES, AND SYSTEMS II, 2003, 5036 : 165 - 170
  • [47] Multi-Wavelength Holographic Interferometry Using the White-Light Laser
    Uno, Katsuhiro
    Saruta, Kouichi
    Yoshida, Naoya
    Suzuki, Masahiro
    Tokita, Yasuhiro
    Fujii, Kan-Ichi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2003, 42 (10): : 6631 - 6636
  • [48] Similarities and Differences between Spatial Coherence Profilometry and White-light Interferometry
    Pavlicek, Pavel
    Takeda, Mitsuo
    INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AN IMAGING, 2010, 1236 : 161 - +
  • [49] COMPENSATION FOR LIGHT SOURCE NOISE IN A SENSITIVE DUAL WAVELENGTH SPECTROPHOTOMETER
    CHANCE, B
    MAYER, D
    GRAHAM, N
    LEGALLAIS, V
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (01): : 111 - +
  • [50] A LED light calibration source for dual-wavelength microscopy
    Beach, JM
    CELL CALCIUM, 1997, 21 (01) : 63 - 68