X pinch: a source of I-10 keV x-rays

被引:4
|
作者
Shelkovenko, TA [1 ]
Pikuz, SA [1 ]
Sinars, DB [1 ]
Chandler, KM [1 ]
Hammer, DA [1 ]
机构
[1] Cornell Univ, Plasma Studies Lab, Ithaca, NY 14853 USA
关键词
D O I
10.1117/12.448464
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Several methods of using the X pinch as a source of x-ray radiation for the radiography of dense plasmas and other objects are presented. These methods do not use pinholes, instead taking advantage of the small source size (<1 mm, and in some cases <2 in at the higher energies) and short x-ray emission duration (<2 ns, and <20 ps in some cases for higher energies) of the X pinch radiation. Detailed measurements of the emission characteristics of X pinches made using different wire materials and in different energy ranges using a set of x-ray diagnostics with high temporal and spatial resolution are presented. Several applications of the X pinch are discussed.
引用
收藏
页码:180 / 187
页数:8
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