Trends for the solution of identification problems in holographic non-destructive testing (HNDT)

被引:4
|
作者
Osten, W [1 ]
Elandaloussi, F [1 ]
Mieth, U [1 ]
机构
[1] BIAS, D-28359 Bremen, Germany
关键词
holographic non-destructive testing identification problems; material fault recognition; inverse problems; active vision;
D O I
10.1117/12.484525
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
in this contribution we give a description of two modem approaches for the solution of identification problems in HNDT. One approach uses an acitive strategy for the classification of fault-indicating fringe patterns that can be described by the term "Recognition by Synthesis". The other approach is more passive but uses a high amount of a-priori knowledge about the appearance of material faults in fringe patterns. The derivation of this a-prion knowledge is supported by the mathematical modeling of the connection between the visible fault indicating pattern and its cause, the hidden material fault under the surface.
引用
收藏
页码:1187 / 1196
页数:10
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