Modeling of Losses in Substrate Integrated Waveguide by Boundary Integral-Resonant Mode Expansion Method

被引：0

作者：

Bozzi, Maurizio ^{[1
]}

Perregrini, Luca ^{[1
]}

Wu, Ke ^{[2
]}

机构：

[1] Univ Pavia, Dept Elect, I-27100 Pavia, Italy

[2] Ecole Polytech Montreal, Dept Elect Engn, Montreal, PQ, Canada

来源：

2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4 | 2008年

关键词：

Equivalent circuit modeling; planar circuit technology; substrate integrated waveguide; waveguide losses;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an efficient technique for the evaluation of different types of losses in substrate integrated waveguide (SIW). This technique is based on the Boundary Integral-Resonant Mode Expansion (BI-RME) method in conjunction with a perturbation approach. This method also permits to derive automatically multimodal and parametric equivalent circuit models of SIW discontinuities, which can be adopted for an efficient design of complex SIW circuits. Moreover, a comparison of losses in different types of planar interconnects (SIW, microstrip, coplanar waveguide) is presented.

引用

页码：514 / +

页数：2

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