High-performance and low-voltage challenges for sub-45nm microprocessor circuits

被引:0
|
作者
Krishnamurthy, RK [1 ]
Mathew, SK [1 ]
Anders, MA [1 ]
Hsu, SK [1 ]
Kaul, H [1 ]
Borkar, S [1 ]
机构
[1] Intel Corp, Microproc Technol Labs, Hillsboro, OR 97124 USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Increasingly aggravated challenges in CMOS technology scaling beyond the 45nm node has resulted in several new design paradigm shifts necessary for high-performance and low-power microprocessors. This paper discusses some of the key technology challenges and the associated design paradigm shifts. High-performance and low-voltage energy-efficient circuit techniques to combat (i) increasing switching and active leakage power dissipation, (ii) poor leakage tolerance of large-signal cache arrays and register files, and (iii) worsening global on-chip interconnect scaling trend, are presented.
引用
收藏
页码:258 / 261
页数:4
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