Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

被引：82

作者：

Riedel, R. ^{[1
,2
]}

Al-Shemmary, A. ^{[3
]}

Gensch, M. ^{[4
]}

Golz, T. ^{[3
]}

Harmand, M. ^{[3
]}

Medvedev, N. ^{[5
]}

Prandolini, M. J. ^{[2
]}

Sokolowski-Tinten, K. ^{[6
,7
]}

Toleikis, S. ^{[3
]}

Wegner, U. ^{[3
]}

Ziaja, B. ^{[5
,8
]}

Stojanovic, N. ^{[3
]}

Tavella, F. ^{[2
]}

机构：

[1] Univ Hamburg, D-22761 Hamburg, Germany

[2] Helmholtz Inst Jena, D-07743 Jena, Germany

[3] Deutsch Elekt Synchrotron DESY, D-22607 Hamburg, Germany

[4] Helmholtz Zent Dresden Rossendorf, D-01328 Dresden, Germany

[5] Ctr Free Elect Laser Sci DESY, D-22607 Hamburg, Germany

[6] Univ Duisburg Essen, Fac Phys, D-47048 Duisburg, Germany

[7] Univ Duisburg Essen, Ctr Nanointegrat Duisburg Essen CENIDE, D-47048 Duisburg, Germany

[8] Inst Nucl Phys, PAN, PL-31342 Krakow, Poland

来源：

NATURE COMMUNICATIONS | 2013年 / 4卷

关键词：

SCATTERING; OPERATION; DYNAMICS;

D O I：

10.1038/ncomms2754

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

The resolution of ultrafast studies performed at extreme ultraviolet and X-ray free-electron lasers is still limited by shot-to-shot variations of the temporal pulse characteristics. Here we show a versatile single-shot temporal diagnostic tool that allows the determination of the extreme ultraviolet pulse duration and the relative arrival time with respect to an external pump-probe laser pulse. This method is based on time-resolved optical probing of the transient reflectivity change due to linear absorption of the extreme ultraviolet pulse within a solid material. In this work, we present measurements performed at the FLASH free-electron laser. We determine the pulse duration at two distinct wavelengths, yielding (184 +/- 14) fs at 41.5nm and (21 +/- 19) fs at 5.5 nm. Furthermore, we demonstrate the feasibility to operate the tool as an online diagnostic by using a 20-nm-thin Si3N4 membrane as target. Our results are supported by detailed numerical and analytical investigations.

引用

页数：7

共 50 条

[41] The development of X-ray free-electron lasers
Pellegrini, C
Reiche, S
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2004, 10 (06) : 1393 - 1404
[42] VUV and X-ray free-electron lasers
Sonntag, B
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 : 8 - 15
[43] Extreme imaging: Macromolecular imaging using x-ray free-electron lasers
Millane, Rick P.
Wojtas, David H.
Arnal, Romain D.
PROCEEDINGS OF THE 2016 INTERNATIONAL CONFERENCE ON IMAGE AND VISION COMPUTING NEW ZEALAND (IVCNZ), 2016, : 291 - 296
[44] Single-shot Measurement of Extreme Ultraviolet Free Electron Laser Pulses
Peters, William
Jones, Travis
Efimov, Anatoly
Pedersoli, Emanuele
Foglia, Laura
Mincigrucci, Riccardo
Nikolov, Ivaylo
Trebino, Rick
Sandberg, Richard
Danailov, Miltcho
Capotondi, Flavio
Bencivenga, Filippo
Bowlan, Pamela
2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2020,
[45] Mode-locked multichromatic x rays in a seeded free-electron laser for single-shot x-ray spectroscopy
Xiang, Dao
Ding, Yuantao
Raubenheimer, Tor
Wu, Juhao
PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 2012, 15 (05):
[46] Temporal characterization of femtosecond x-ray pulse sat free-electron lasers
Behrens, Christopher
X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS X, 2013, 8849
[47] Design and implementation of timing system for single-shot imaging at Shanghai soft X-ray free-electron laser
Nie Yong-Gan
Gao Zi-Chen
Tong Ya-Jun
Fan Jia-Dong
Liu Gong-Fa
Jiang Huai-Dong
ACTA PHYSICA SINICA, 2024, 73 (12)
[48] Flow-aligned, single-shot fiber diffraction using a femtosecond X-ray free-electron laser
Popp, David
Loh, N. Duane
Zorgati, Habiba
Ghoshdastider, Umesh
Liow, Lu Ting
Ivanova, Magdalena I.
Larsson, Marten
DePonte, Daniel P.
Bean, Richard
Beyerlein, Kenneth R.
Gati, Cornelius
Oberthuer, Dominik
Arnlund, David
Branden, Gisela
Berntsen, Peter
Cascio, Duilio
Chavas, Leonard M. G.
Chen, Joe P. J.
Ding, Ke
Fleckenstein, Holger
Gumprecht, Lars
Harimoorthy, Rajiv
Mossou, Estelle
Sawaya, Michael R.
Brewster, Aaron S.
Hattne, Johan
Sauter, Nicholas K.
Seibert, Marvin
Seuring, Carolin
Stellato, Francesco
Tilp, Thomas
Eisenberg, David S.
Messerschmidt, Marc
Williams, Garth J.
Koglin, Jason E.
Makowski, Lee
Millane, Rick P.
Forsyth, Trevor
Boutet, Sebastien
White, Thomas A.
Barty, Anton
Chapman, Henry
Chen, Swaine L.
Liang, Mengning
Neutze, Richard
Robinson, Robert C.
CYTOSKELETON, 2017, 74 (12) : 472 - 481
[49] High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation
Makita, M.
Karvinen, P.
Zhu, D.
Juranic, P. N.
Gruenert, J.
Cartier, S.
Jungmann-Smith, J. H.
Lemke, H. T.
Mozzanica, A.
Nelson, S.
Patthey, L.
Sikorski, M.
Song, S.
Feng, Y.
David, C.
OPTICA, 2015, 2 (10): : 912 - 916
[50] Single-shot transverse coherence in seeded and unseeded free-electron lasers: A comparison
Pop, M.
Allaria, E.
Curbis, F.
Geloni, G.
Manfredda, M.
Di Mitri, S.
Foglia, L.
Garzella, D.
Giannessi, L.
Mahieu, B.
Mahne, N.
Mirian, N.
Penco, G.
Perosa, G.
Ribic, P. R.
Simoncig, A.
Spampinati, S.
Spezzani, C.
Trovo, M.
Werin, S.
Zangrando, M.
De Ninno, G.
PHYSICAL REVIEW ACCELERATORS AND BEAMS, 2022, 25 (04)

← 1 2 3 4 5 →