共 50 条
- [21] Preparation and characterization of Al2O3 thin films for spectroscopic studies ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2011, 241
- [22] Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry 2001 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS, 2000, : 513 - 518
- [24] Spectroscopic ellipsometry study of In2O3 thin films Journal of Materials Science: Materials in Electronics, 2009, 20 : 71 - 75
- [29] Electrical and optical properties of thin β-FeSi2 films on Al2O3 substrates Applied Surface Science, 1995, 91 (1-4):