Geometric Modeling of Illumination on the TFT-LCD Panel using Bezier Surface

被引：0

作者：

Lee, Kyong-min ^{[1
]}

Chang, Moon Soo ^{[1
]}

Park, PooGyeon ^{[1
]}

机构：

[1] POSTECH, Dept Elect & Elect Engn, Pohang, South Korea

来源：

PROCEEDINGS OF WORLD ACADEMY OF SCIENCE, ENGINEERING AND TECHNOLOGY, VOL 26, PARTS 1 AND 2, DECEMBER 2007 | 2007年 / 26卷

关键词：

Bezier; defect; geometric modeling; illumination; inspection; LCD; panel;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

In this paper, we propose a geometric modeling of illumination on the patterned image containing etching transistor. This image is captured by a commercial camera during the inspection of a TFT-LCD panel. Inspection of defect is an important process in the production of LCD panel, but the regional difference in brightness, which has a negative effect on the inspection, is due to the uneven illumination environment. In order to solve this problem, we present a geometric modeling of illumination consisting of an interpolation using the least squares method and 3D modeling using bezier surface. Our computational time, by using the sampling method, is shorter than the previous methods. Moreover, it can be further used to correct brightness in every patterned image.

引用

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页码：70 / 73

页数：4

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