Jitter analysis of a superconducting nanowire single photon detector

被引:116
|
作者
You, Lixing [1 ]
Yang, Xiaoyan [1 ,2 ]
He, Yuhao [1 ,2 ]
Zhang, Wenxing [1 ,2 ]
Liu, Dengkuan [1 ,2 ]
Zhang, Weijun [1 ]
Zhang, Lu [1 ]
Zhang, Ling [1 ,2 ]
Liu, Xiaoyu [1 ]
Chen, Sijing [1 ,2 ]
Wang, Zhen [1 ]
Xie, Xiaoming [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
[2] Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
来源
AIP ADVANCES | 2013年 / 3卷 / 07期
基金
中国国家自然科学基金;
关键词
NM WAVELENGTH; SYSTEM; EFFICIENCY;
D O I
10.1063/1.4817581
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Jitter is one of the key parameters for a superconducting nanowire single photon detector (SNSPD). Using an optimized time-correlated single photon counting system for jitter measurement, we extensively studied the dependence of system jitter on the bias current and working temperature. The signal-to-noise ratio of the single-photon-response pulse was proven to be an important factor in system jitter. The final system jitter was reduced to 18 ps by using a high-critical-current SNSPD, which showed an intrinsic SNSPD jitter of 15 ps. A laser ranging experiment using a 15-ps SNSPD achieved a record depth resolution of 3 mm at a wavelength of 1550 nm. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
引用
收藏
页数:6
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