Take advantage of fast Ethernet PHY testing

被引：0
|
作者：
Katz, J [1 ]
Capriglione, G [1 ]
机构：
[1] Lucent Technol, Microelect Grp, Milpitas, CA 95035 USA
来源：
ELECTRONIC DESIGN | 1999年 / 47卷 / 17期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：67 / +
页数：4
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