Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Pure Niobium Using Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy

被引:50
|
作者
Kim, Yoon-Jun [1 ]
Tao, Runzhe [2 ]
Klie, Robert F. [2 ]
Seidman, David N. [1 ,3 ]
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[2] Univ Illinois, Dept Phys, Chicago, IL 60607 USA
[3] Northwestern Univ, Ctr Atom Probe Tomog NUCAPT, Evanston, IL 60208 USA
基金
美国能源部; 美国国家科学基金会;
关键词
Nb; NbH; Nb oxides; atom-probe tomography; aberration-corrected STEM; annular bright-field images; SYSTEM; HYDRIDES; VANADIUM; EELS; STEM;
D O I
10.1021/nn305029b
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Imaging the three-dimensional atomic-scale structure of complex interfaces has been the goal of many recent studies, due to its importance to technologically relevant areas. Combining atom-probe tomography and aberration-corrected scanning transmission electron microscopy (STEM), we present an atomic-scale study of ultrathin (similar to 5 nm) native oxide layers on niobium (Nb) and the formation of ordered niobium hydride phases near the oxide/Nb interface. Nb, an elemental type-II superconductor with the highest critical temperature (T-c = 9.2 K), is the preferred material for superconducting radio frequency (SRF) cavities in next-generation particle accelerators. Nb exhibits high solubilities for oxygen and hydrogen, especially within the RF-field penetration depth, which is believed to result in SRF quality factor losses. STEM imaging and electron energy-loss spectroscopy followed by ultraviolet laser-assisted local-electrode atom-probe tomography on the same needle-like sample reveals the NbO2, Nb2O5, NbO, Nb stacking sequence; annular bright-field imaging is used to visualize directly hydrogen atoms in bulk beta-NbH.
引用
收藏
页码:732 / 739
页数:8
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