Generalized Multishearing Interferometry for the Complete Multidimensional Characterization of Optical Beams and Ultrashort Pulses

被引:0
|
作者
Wyatt, Adam S. [1 ]
Biegert, Jens [2 ]
Walmsley, Ian A. [1 ]
机构
[1] Univ Oxford, Clarendon Lab, Parks Rd, Oxford OX1 3PU, England
[2] ICFO Inst Ciencies Foton, Barcelona 08860, Spain
关键词
ELECTRIC-FIELD;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate increased accuracy and precision in the reconstruction of the multidimensional phase of electromagnetic fields based on multiple spectral shearing interferometry measurements made with shears of an arbitrary magnitude. (C) 2011 Optical Society of America
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页数:2
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