Measurement of the remnant magnetic-field in Lorentz mode using permalloy

被引：1

作者：

Liu, Haihua ^{[1
]}

Duan, Xiaokun ^{[2
]}

Che, Renchao ^{[1
]}

Wang, Zhifeng ^{[1
]}

Duan, Xiaofeng ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing Lab Elect Microscopy, Beijing 100190, Peoples R China

[2] Adv Technol & Mat Co Ltd, Beijing 100081, Peoples R China

来源：

ACTA METALLURGICA SINICA-ENGLISH LETTERS | 2009年 / 22卷 / 06期

基金：

中国国家自然科学基金;

关键词：

Lorentz electron microscopy; Lorentz lens; Remnant magnetic field; Permalloy; Cross-tie walls;

D O I：

10.1016/S1006-7191(08)60120-9

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.

引用

页码：435 / 439

页数：5

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