Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions

Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion coefficient, we can perform constant height measurements and achieve atomic resolution in both AFM and STM on various samples. Moreover, the design allows a wide angle optical access to the sensor and the sample that is of interest for combining with optical microscopes or focusing optics with a high numerical aperture. Published under license by AlP Publishing.