Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)

被引：98
|
作者：
Bhaduri, Basanta [1 ]
Mohan, N. Krishna
Kothiyal, M. P.
Sirohi, R. S.
机构：
[1] Indian Inst Technol, Dept Phys, Appl Opt Lab, Madras 600036, Tamil Nadu, India
[2] Barkatullah Univ, Bhopal 422026, MP, India
来源：
OPTICS EXPRESS | 2006年 / 14卷 / 24期
关键词：
D O I：
10.1364/OE.14.011598
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Digital speckle pattern interferometry ( DSPI) and digital shearography ( DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting ( SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative ( slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis. (c) 2006 Optical Society of America.
引用
收藏
页码：11598 / 11607
页数：10
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