Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors

被引：0
|
作者：
Mahajan, Bikram Kishore [1 ]
Chen, Yen-Pu [1 ]
Alam, Muhammad Ashraful [1 ]
Rivera, Ulisses Alberto Heredia [2 ]
Rahimi, Rahim [2 ]
机构：
[1] Purdue Univ, Elmore Family Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
P52
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页数：1
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