Testing second-order delta-sigma modulators using pseudo-random patterns

被引：3

作者：

Ong, CK ^{[1
]}

Huang, JL ^{[1
]}

Cheng, KT ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA

来源：

MICROELECTRONICS JOURNAL | 2002年 / 33卷 / 10期

关键词：

delta-sigma modulation; analog-to-digital converter testing; pseudo-random sequence; structural testing;

D O I：

10.1016/S0026-2692(02)00096-4

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-bit second-order delta-sigma modulators are commonly used in high-resolution analog-to-digital converters (ADCs). This type of modulator requires high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator by characterizing its key parameters using a pseudo-random pattern sequence. This technique is suitable for BIST application since a pseudo-random sequence can be generated on-chip using LFSR. Numerical simulation results show that this technique is capable of identifying parameters that affect the performance of a second-order delta-sigma modulator ADC. (C) 2002 Published by Elsevier Science Ltd.

引用

页码：807 / 814

页数：8

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