INVITED: RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs

被引：0

作者：

Park, Hee Chun ^{[1
]}

Chang, Kyungwook ^{[1
]}

Ku, Bon Woong ^{[1
]}

Kim, Jinwoo ^{[1
]}

Lee, Edward ^{[1
]}

Kim, Daehyun ^{[1
]}

Chaudhuri, Arjun ^{[2
]}

Banerjee, Sanmitra ^{[2
]}

Mukhopadhyay, Saibal ^{[1
]}

Chakrabarty, Krishnendu ^{[2
]}

Lim, Sung Kyu ^{[1
]}

机构：

[1] Georgia Inst Technol, Dept Elect & Comp Engn, Atlanta, GA 30332 USA

[2] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27706 USA

来源：

PROCEEDINGS OF THE 2019 56TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | 2019年

关键词：

D O I：

10.1145/3316781.3323486

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

Monolithic 3D IC overcomes the limitation of the existing through-silicon-via (TSV) based 3D IC by providing denser vertical connections with nano-scale inter-layer vias (ILVs). In this paper, we demonstrate a thorough RTL-to-GDS design flow for monolithic 3D IC, which is based on commercial 2D place-and-route (P&R) tools and clever ways to extend them to handle 3D IC designs and simulations. We also provide a low-cost built-in-self-test (BIST) method to detect various faults that can occur on ILVs. Lastly, we present a resistive random access memory (ReRAM) compiler that generates memory modules that are to be integrated in monolithic 3D ICs.

引用

页数：4

共 37 条

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Kim, Jinwoo
Murali, Gauthaman
Vanna-iampikul, Pruek
Lee, Edward
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Chaudhuri, Arjun
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Chakrabarty, Krishnendu
Mukhopadhyay, Saibal
Lim, Sung Kyu
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Park, Heechun
Ku, Bon Woong
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Lim, Sung Kyu
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Zhu, Lingjun
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Chakrabarty, Krishnendu
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[J]. ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2022, 18 (01)
[4] A Design-for-Test Solution for Monolithic 3D Integrated Circuits
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Zhu, Lingjun
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[J]. 2023 60TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, DAC, 2023,
[7] A new die-level flexible design-for-test architecture for 3D stacked ICs
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[J]. INTEGRATION-THE VLSI JOURNAL, 2024, 97
[8] Design Automation and Testing of Monolithic 3D ICs: Opportunities, Challenges, and Solutions
Chang, Kyungwook
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[J]. 2017 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2017, : 805 - 810
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Chaudhuri, Arjun
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Mukhopadhyay, Saibal
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