Error feedback based noise shaping in a double sampled ADC

被引：1

作者：

Sarma, Vineeth ^{[1
]}

Sahoo, Bibhudatta ^{[1
]}

机构：

[1] Amrita Vishwa Vidyapeetham Univ, Dept Elect & Commun, Kollam 690525, Kerala, India

来源：

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | 2014年 / 78卷 / 02期

关键词：

Double sampled; Error feedback; First order shaping; Low-gain op amp; DELTA-SIGMA MODULATOR; DYNAMIC-RANGE; BANDWIDTH;

D O I：

10.1007/s10470-013-0174-z

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A first order error feedback based noise shaping ADC, that obviates the need for high-gain and high output-swing op amps and fast-settling, power-hungry, and noisy reference buffers is proposed. Using a single stage op amp with a gain of 70 (i.e. 37 dB) and output swing of +/- 75 mV, this topology, realized in GPDK 90-nm CMOS technology, achieves an SNDR of 63 dB operating at 1 GHz (effective sample rate of 2 GHz due to double sampling) with an OSR of 32.

引用

页码：421 / 430

页数：10

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