Visible light activity of nitrogen-doped TiO2 thin films grown by atomic layer deposition

被引:38
|
作者
Cheng, Hsyi-En [1 ]
Lee, Wen-Jen [2 ]
Hsu, Ching-Ming [1 ]
Hon, Ming-Hsiung [2 ]
Huang, Chien-Lung [3 ]
机构
[1] So Taiwan Univ, Dept Electroopt Engn, Tainan 710, Taiwan
[2] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 710, Taiwan
[3] Metal Ind Res & Dev Ctr, Micro Meso Mech Mfg Res & Dev Dept, Surface Engn & Heat Treatment Sect, Kaohsiung 811, Taiwan
关键词
D O I
10.1149/1.2968951
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
This article demonstrates that a visible light active N-doped TiO2 film can be fabricated by atomic layer deposition (ALD) with titanium chloride and ammonia water as the precursors. A 1.60 atom % N-doping anatase TiO2 film has been successfully grown on an n(+)-silicon substrate. The ratio of substitutional N doping to the total N doping as high as 70% is achieved that extends the long-wavelength cutoff of TiO2 to 550 nm. Results from the analysis of incident photon-to-current efficiency and potential-dependent photocurrent density suggest that the visible light activity of ALD N-doped TiO2 films can be further improved by reducing the carrier recombination rate and increasing optical absorption efficiency. (C) 2008 The Electrochemical Society.
引用
收藏
页码:D81 / D84
页数:4
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