Interaction of oxygen with palladium deposited on a thin alumina film

被引:102
|
作者
Shaikhutdinov, S
Heemeier, M
Hoffmann, J
Meusel, I
Richter, B
Bäumer, M
Kuhlenbeck, H
Libuda, J
Freund, HJ
Oldman, R
Jackson, SD
Konvicka, C
Schmid, M
Varga, P
机构
[1] Max Planck Gesell, Fritz Haber Inst, Phys Chem Abt, D-14195 Berlin, Germany
[2] ICI Technol, Runcorn WA7 4QD, Cheshire, England
[3] Univ Glasgow, Dept Chem, Glasgow G12 8QQ, Lanark, Scotland
[4] Vienna Univ Technol, Inst Allgemeine Phys, A-1040 Vienna, Austria
关键词
palladium; aluminum oxide; oxidation; carbon monoxide; chemisorption;
D O I
10.1016/S0039-6028(01)01850-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The interaction of oxygen with Pd particles. vapor deposited onto a thin alumina film grown on a NiAl(1 1 0) substrate. was studied by STM. AES, LEED, XPS. TPD and molecular beam techniques. The results show that O-2 exposure at 400-500 K strongly influences the oxide support. We suggest that the oxygen atoms formed by dissociation on the Pd surface can diffuse through the alumina film and react with the NiAl substrate underneath the Pd particles, thus increasing the thickness of the oxide film. The surface oxygen inhibits hydrogen adsorption. and readily reacts with CO at 300-500 K, For large and crystalline Pd particles, the system exhibits adsorption-desorption properties which are very similar to those of the Pd(1 1 1) single crystal surface. The molecular beam and TPD experiments reveal that, at low coverage. CO adsorbs slightly stronger on the smaller Pd particles, with an adsorption energy difference of approximate to5-7 kJ mol(-1) for 1 and 3-5 nm Pd particles studied. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
下载
收藏
页码:270 / 281
页数:12
相关论文
共 50 条
  • [41] Mechanism of the oxygen interaction with a surface of thin nanosized metal oxide film
    Brinzari, VI
    Dmitriev, SV
    Korotcenkov, GS
    Semiconductor Materials for Sensing, 2005, 828 : 241 - 246
  • [42] Xylene sensor using double-layered thin film and Ni-deposited porous alumina
    Akiyama, Tomo
    Ishikawa, Yurie
    Hara, Kazuhiro
    SENSORS AND ACTUATORS B-CHEMICAL, 2013, 181 : 348 - 352
  • [43] Atomic layer deposited alumina (Al2O3) coating on thin film cryoresistors
    Hahtela, O.
    Satrapinski, A.
    Sievilae, P.
    Chekurov, N.
    2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2008, : 272 - +
  • [44] DIELECTRIC BREAKDOWN OF THIN ALUMINA FILM
    KAWAMURA, H
    AZUMA, K
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1953, 8 (06) : 797 - 798
  • [45] EXTENSION OF FRACTURE LIFETIME OF SILICON SCANNING MICROMIRROR BY COATING WITH ATOMIC LAYER DEPOSITED ALUMINA THIN FILM
    Fujita, Yuuki
    Sasaki, Takashi
    Fukuda, Koichi
    Nguyen Thanh Tung
    Ogawa, Fumio
    Hashida, Toshiyuki
    Hane, Kazuhiro
    2021 21ST INTERNATIONAL CONFERENCE ON SOLID-STATE SENSORS, ACTUATORS AND MICROSYSTEMS (TRANSDUCERS), 2021, : 549 - 552
  • [46] STM/AFM studies of the catalytic reaction of oxygen with hydrogen on the surface of thin palladium film
    Kobiela, T
    Dus, R
    VACUUM, 2001, 63 (1-2) : 267 - 276
  • [47] Hydrogen Removal From e-beam Deposited Alumina Thin Films By Oxygen Ion Beam
    Das, Arijeet
    Mukharjee, C.
    Rajiv, K.
    Bose, Aniruddha
    Singh, S. D.
    Phase, D. M.
    Rai, S. K.
    Ganguli, Tapas
    Joshi, S. C.
    Deb, S. K.
    SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B, 2014, 1591 : 919 - 921
  • [48] ENERGY OF INTERACTION BETWEEN GRAINS OF VERY THIN FILM DEPOSITED IN PRESENCE OF ELECTRIC FIELD
    LEBAS, J
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1971, 273 (21): : 930 - &
  • [49] CORROSION INHIBITION IN SPUTTER-DEPOSITED THIN-FILM SYSTEMS USING AN INTERMEDIARY LAYER OF PALLADIUM
    SHARP, DJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 204 - 207
  • [50] INFLUENCE OF DISPERSE STRUCTURE OF PALLADIUM AND RHENIUM DEPOSITED ON ALUMINA ON DISPERSITY OF PLATINUM
    SOVOSTIN, YA
    ZAIDMAN, NM
    MILOVA, LP
    KOLOMIYCHUK, VN
    KOZHEVNIKOVA, NG
    BORBAT, SP
    REACTION KINETICS AND CATALYSIS LETTERS, 1975, 2 (03): : 273 - 281