Effect of densification distribution on the Young's modulus of porous coatings after nano-indentation

被引:5
|
作者
Lu, Xiaojuan [1 ]
Xiao, Ping [2 ]
Li, Haiyan [3 ]
机构
[1] N China Elect Power Univ, Sch Environm Sci & Engn, Baoding 071000, Peoples R China
[2] Univ Manchester, Sch Mat, Manchester M1 7HS, Lancs, England
[3] Univ Manchester, Sch Mech Aerosp & Civil Engn, Manchester M60 1QD, Lancs, England
关键词
Film; Mechanical property; Finite element simulation; Porosity; Electron Microscopy; THERMAL BARRIER COATINGS; ELASTIC-MODULUS; MECHANICAL-PROPERTIES; SPHERICAL INDENTATION; NANOINDENTATION; POROSITY; HARDNESS; SOLIDS; DEPTH; LOAD;
D O I
10.11890/1006-7191-125-383
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
Nano-indentation of a porous ceramic coating leads to crushing and densification of the coating under the indenter. In this work, finite element simulations of indentation on the porous coating have been carried out to study the effect of the size and distribution of densification on Young's modulus measured by nano-indentation. Two totally different distribution patterns have been simulated in this work. In the case of gradient densification, the Young's modulus increased by 8.6% when the densification has occurred in the maximum influenced area. While the Young's modulus increased by 2% with a uniformed densification. Examinations of the cross-section of the coatings have suggested that the densification after the indentation is close to the second model. The measured Young's modulus could have differed by 2%. The effect of densification on the Young's modulus measured by using nano-indentation is strongly dependent on the densification patterns of the porous coating.
引用
下载
收藏
页码:383 / 390
页数:8
相关论文
共 50 条
  • [41] Determination of Young's modulus by spherical indentation
    N. Huber
    D. Munz
    Ch Tsakmakis
    Journal of Materials Research, 1997, 12 : 2459 - 2469
  • [42] Nano-indentation nanohardness and elastic modulus evolution of molybdenum processed by high-pressure torsion
    Xue, Ke-Min
    Wang, Zhe
    Wang, Xue
    Zhou, Yu-Feng
    Li, Ping
    MATERIALS SCIENCE AND TECHNOLOGY, 2021, 37 (07) : 716 - 724
  • [43] Evaluation of elastic modulus and hardness of Fe-Al base intermetallics by nano-indentation techniques
    Frutos, E.
    Morris, D. G.
    Munoz-Morris, M. A.
    INTERMETALLICS, 2013, 38 : 1 - 3
  • [44] A simple basis for determination of the modulus and hydraulic conductivity of human ocular surface using nano-indentation
    Swain, M. V.
    Nohava, J.
    Eberwein, P.
    ACTA BIOMATERIALIA, 2017, 50 : 312 - 321
  • [45] Nano-indentation modulus and hardness of β-Ti and γ-TiAl phases in Ti-Al-Cr system
    Okada, Yotaro
    Taniguchi, Sota
    Yamagata, Ryosuke
    Nakashima, Hirotoyo
    Takeyama, Masao
    MRS ADVANCES, 2021, 6 (06) : 183 - 186
  • [46] Errors in resolved modulus during nano-indentation of hard films on soft substrates: A computational study
    Chollacoop, N.
    Li, L.
    Gouldstone, A.
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 423 (1-2): : 36 - 40
  • [47] Microstructural Analysis of Nickel-Based Composite Coatings and Their Effect on Micro-hardness and Nano-indentation Behavior
    Azzoug, Rabah
    Hellal, Fatah
    Mebdoua, Yamina
    COMPUTATIONAL METHODS AND EXPERIMENTAL TESTING IN MECHANICAL ENGINEERING, CAM 2017, 2019, : 51 - 62
  • [48] Study on the crack resistance of CrBN composite coatings via nano-indentation and scratch tests
    Wang, Qianzhi
    Zhou, Fei
    Callisti, Mauro
    Polcar, Tomas
    Kong, Jizhou
    Yan, Jiwang
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 708 : 1103 - 1109
  • [49] Analysis of the equivalent indenter concept used to extract Young's modulus from a nano-indentation test: some new insights into the Oliver-Pharr method
    Andriollo, Tito
    Thorborg, Jesper
    Hattel, Jesper
    MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING, 2017, 25 (04)
  • [50] Spatial distribution of strain and phases in Si nano-indentation analysed by Raman mapping
    Demangeot, F
    Puech, P
    Paillard, V
    Domnich, V
    Gogotsi, YG
    GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, 2002, 82-84 : 777 - 782