Growth and properties of REBiO3 new buffer materials for coated conductors

被引:5
|
作者
Li, G. [1 ]
Pu, M. H. [1 ]
Sun, R. P. [1 ]
Wang, W. T. [1 ]
Zhang, X. [1 ]
Zhang, H. [1 ,2 ]
Yang, Y. [1 ]
Zhang, Y. [1 ]
Zhang, H. [1 ,2 ]
Cheng, C. H. [1 ,3 ]
Zhao, Y. [1 ,3 ]
机构
[1] SW Jiaotong Univ, SRDC, Minist Educ China, Key Lab Adv Technol Mat, Chengdu 610031, Sichuan, Peoples R China
[2] Peking Univ, Dept Phys, Beijing 100871, Peoples R China
[3] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
来源
关键词
ABO(3)-type; stabilizer; REBiO3; buffer layer;
D O I
10.1016/j.physc.2008.05.271
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new series of ABO(3)-type REBiO3 have been derived from the system Bi2O3-RE2O3, in which cubic RE2O3 stabilize cubic structure of delta-Bi2O3, enabling the formation of REBiO3 at relatively low temperature range. A chemical solution deposition (CSD) route has been used to deposit epitaxial thin films of REBiO3. The crystal lattice, chemical stability, texture development, combined with the successful deposition of high quality superconducting layer demonstrate that the newly developed compounds may play as potential alternatives of buffer layer materials for REBCO-based coated conductors. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1601 / 1605
页数:5
相关论文
共 50 条
  • [41] Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer
    Li Mei-Ya
    Wang Jing
    Liu Jun
    Yu Ben-Fang
    Guo Dong-Yun
    Zhao Xing-Zhong
    ACTA PHYSICA SINICA, 2008, 57 (05) : 3132 - 3137
  • [42] Epitaxial nucleation and growth of buffer layers and Y123 coated conductors deposited by metal-organic decomposition
    Castaño, O
    Palau, A
    González, JC
    Piñol, S
    Puig, T
    Mestres, N
    Sandiumenge, F
    Obradors, X
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2002, 372 (PART 2): : 806 - 809
  • [43] Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer
    Department of Physics, Wuhan University, Wuhan 430072, China
    不详
    Wuli Xuebao, 2008, 5 (3132-3137):
  • [44] Epitaxial growth of gradient Ce1-xZrxO2 buffer layer for YBa2Cu3O7-δ coated conductors
    Li Limin
    Zhao Gaoyang
    Lei Li
    Yan Fuxue
    Jia Jiqiang
    Liu Xiaoqin
    He Yang
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2019, 560 : 26 - 30
  • [45] Effect of post-annealing in low oxidizing atmosphere on the properties of CeO2 buffer layer for coated conductors
    Wang, Y.
    Li, C. S.
    Feng, J. Q.
    Jin, L. H.
    Yu, Z. M.
    Gao, L.
    Wang, H.
    MATERIALS CHEMISTRY AND PHYSICS, 2018, 215 : 81 - 90
  • [46] Improved morphological and barrier properties of lanthanum zirconium oxide buffer layers obtained by chemical solution deposition for coated conductors
    Y. Wang
    C. S. Li
    J. Q. Feng
    Z. M. Yu
    L. H. Jin
    G. Y. Zhao
    L. Lei
    P. X. Zhang
    Journal of Materials Science: Materials in Electronics, 2016, 27 : 4336 - 4343
  • [47] Improved morphological and barrier properties of lanthanum zirconium oxide buffer layers obtained by chemical solution deposition for coated conductors
    Wang, Y.
    Li, C. S.
    Feng, J. Q.
    Yu, Z. M.
    Jin, L. H.
    Zhao, G. Y.
    Lei, L.
    Zhang, P. X.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 27 (05) : 4336 - 4343
  • [48] Growth of Nd2O3 buffer layers on Ni tapes by reel-to-reel sol-gel process for YBCO coated conductors
    Celik, E
    Hascicek, YS
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2004, 106 (01): : 1 - 5
  • [49] Growth of epitaxial Y2O3 buffer layers on biaxially textured Ni-W substrates for YBCO coated conductors by MOD approach
    Bhuiyan, MS
    Paranthaman, M
    Kang, S
    Lee, DF
    Salama, K
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2005, 422 (3-4): : 95 - 101
  • [50] Growth of thick MOD-derived CeO2-x buffer layer with less residual carbon for coated conductors
    Wang, H.
    Cao, L. Y.
    Wang, Y.
    Jin, L. H.
    Liu, J. Y.
    Huang, J. F.
    Li, C. S.
    Yu, Z. M.
    Zhang, P. X.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (11) : 8949 - 8953