Yield and Energy Tradeoffs of an NVLatch Design using Radial Sampling

被引:0
|
作者
Issa, Adam [1 ]
Kanj, Rouwaida [1 ]
Chehab, Ali [1 ]
Joshi, Rajiv [2 ]
机构
[1] Amer Univ Beirut, Beirut 11072020, Lebanon
[2] IBM TJ Watson Res Labs, Yorktown Hts, NY 10598 USA
关键词
Integrated circuit design; yield; nonvolatile memory; Spin Transfer Torque;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Nonvolatile latches are increasingly popular with the advent of IoT design. We study the yield energy tradeoff of the backup mechanism of an STT-MTJ based nonvolatile latch. For the yield analysis, we rely on Hicks and Wheeling methodology for multi-cone radial sampling for the purpose of rare fail estimation. Yield is shown to be delimited by the Parallel-to-AntiParallel magnetic angle transitions. To accommodate for the slower cells, we note an increase in the average energy requirements for the backup mechanism. Simulations indicate an increase of 10%-40% for the average energy requirements to achieve an ideal yield requirement close to 99% for different number of components.
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页数:4
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