Application of computer vision in automatic instrument metrology and calibration

被引：0
|
作者：
Gao, SH
Zhao, SP
机构：
来源：
ISTM/97 - 2ND INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, CONFERENCE PROCEEDINGS | 1997年
关键词：
computer vision; automatic metrology; image process; pattern recognition; data analysis;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, die application of computer vision technology in automatic instrument calibration is investigated and explored. Based on the analysis of die drawbacks of the traditional approaches to instrument calibration, a new whole-process automatic instrument calibration scheme by computer vision and image process technology is presented and discussed. The theoretical predication and the experiment results show that this scheme advocated in the paper is feasible, and have a wide variety of application.
引用
收藏
页码：63 / 65
页数：3
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