The recrystallization behavior study of 3%Si nonoriented electrical steel

被引:0
|
作者
Shi, Wen Min [1 ,2 ]
Liu, Jing [2 ]
Li, Chang Yi [2 ]
机构
[1] Wuhan Univ Sci & Technol, Wuhan 430081, Peoples R China
[2] Natl Engn & Res Ctr Silicon Steel, Wuhan 430080, Peoples R China
来源
关键词
nonoriented electrical steel; recrystallization texture; OIM; recrystallization mechanisms; TEXTURE; GROWTH;
D O I
10.4028/www.scientific.net/AMR.535-537.678
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The recrystallization behavior of the cold rolled 3%Si nonoriented electrical steel at different temperatures is investigated by OIM(Orientation Imaging Microscopy). The results show that the recrystallization process and texture of 3%Si nonoriented electrical steel at different temperatures are determinated by different recrystallization mechanisms. At low annealing temperatures, the formation of recrystallization texture in this specimen can be explained by the mechanism of oriented nucleation theory, but at higher annealing temperatures, the formation of recrystallization texture in this specimen can be explained by the mechanism of oriented growth theory, the twin nucleation mechanism may penetrate the whole recrystallization process.
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页码:678 / +
页数:2
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