Failure Mechanisms Research of CCD Imaging Devices Induced by Pulsed Laser

被引：0

作者：

Qiua, Dongdong ^{[1
]}

Li, Hongbin ^{[1
]}

Ping, Heng ^{[1
]}

Jin, Huasong ^{[1
]}

Liu, Siliang ^{[1
]}

机构：

[1] China Satellite Maritime Tracking & Controlling D, Jiangyin 214431, Peoples R China

来源：

OPTICAL, ELECTRONIC MATERIALS AND APPLICATIONS II | 2012年 / 529卷

关键词：

Pulsed laser; CCD imaging device; Damage mechanisms; Bright line; Black screen; RADIATION-DAMAGE; DETECTORS;

D O I：

10.4028/www.scientific.net/AMR.529.110

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Aiming at the phenomenon that irreversible bright line and all screen black happens in the CCDs irradiated by pulsed laser, the resistance between driving electrodes and substrate was measured, damage micro-morphology of different layers in the facular area was observed, exported waveforms were detected, the damage mechanisms for CCD were analyzed in detail. The coming results show that high power pulse laser induced the ablation at different layers of CCD, increased the dark current and leakage current, which induced the failure of the device.

引用

页码：110 / 114

页数：5

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