Structural and photoluminescence characterization of SnO2: F thin films deposited by advanced spray pyrolysis technique at low substrate temperature

被引:73
|
作者
Shewale, P. S. [1 ]
Sim, Kyu Ung [3 ]
Kim, Ye-bin [3 ]
Kim, J. H. [3 ]
Moholkar, A. V. [2 ]
Uplane, M. D. [1 ]
机构
[1] Shivaji Univ, Dept Elect, Thin Film Phys Lab, Kolhapur 416004, Maharashtra, India
[2] Shivaji Univ, Dept Phys, Kolhapur 416004, Maharashtra, India
[3] Chonnam Natl Univ, Dept Mat Sci & Engn, Kwangju 500757, South Korea
关键词
Fluorine doped tin oxide; Thin films; Substrate temperature; Photoluminescence; OPTICAL-PROPERTIES; ANNEALING TEMPERATURE; NANOWIRES; NANOPARTICLES; LUMINESCENCE; SPECTRA; RAMAN; CVD;
D O I
10.1016/j.jlumin.2013.01.021
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Fluorine doped tin oxide (FTO) thin films were deposited on glass substrates, at different substrate temperatures using advanced spray pyrolysis technique. X-ray diffraction studies showed that the crystallinity of the thin films increased with increasing substrate temperature. FESEM and AFM studies support the conclusions drawn from X-ray diffraction studies. X-ray photoelectron studies confirm oxygen deficiency in formation of the FTO nanocrystallites. The photoluminescence of the FTO films were investigated. It was found that, room temperature photoluminescence spectra are dominated by oxygen vacancies and exhibit a rich violet photoluminescence band about similar to 404 rim with an extensively feeble red emission about 700 nm. The Photoluminescence intensity varies with the substrate temperature. The photoemission position is observed to be independent of substrate temperature. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:113 / 118
页数:6
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