Secondary electron emission from MgO protective layer by Auger neutralization of ions

被引：15
|
作者：
Uhm, Han S. [1 ]
Choi, Eun H. [2 ]
Cho, Guang S. [2 ]
机构：
[1] Ajou Univ, Dept Mol Sci & Technol, Suwon 443949, South Korea
[2] Kwangwoon Univ, PDP Res Ctr, Dept Electrophys, Seoul 139701, South Korea
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 03期
关键词：
Auger effect; electronic density of states; ionisation; magnesium compounds; secondary electron emission; valence bands; work function; ABSORPTION;
D O I：
10.1063/1.3073983
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A theoretical model of the secondary electron emission yield (gamma) from a MgO layer is developed based on the Auger neutralization of ions, resulting in an analytical expression of gamma in terms of the ionization energy E-i for the density of states in the valence band, being an exponentially decaying function of the energy deviation from the band characteristic energy of 7.88 eV. The analytical expression recovers the previously known empirical formulation of gamma similar to(E-i-2 phi) for the work function phi. Results of the theoretical model agree well with the measured data in terms of the data trend.
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页数：3
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