Submicron characterization of recording media using magnetic force microscopy

被引：0
|
作者：
Babcock, K
Manalis, S
Elings, V
Dugas, M
Challener, W
机构：
[1] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103
[2] ADV RES CORP,MINNEAPOLIS,MN 55414
[3] 3M CO,ST PAUL,MN 55414
来源：
JOURNAL OF APPLIED PHYSICS | 1996年 / 79卷 / 08期
关键词：
D O I：
10.1063/1.361965
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：6440 / 6440
页数：1
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