Opportunities and pitfalls in patterned self-catalyzed GaAs nanowire growth on silicon

被引:37
|
作者
Gibson, Sandra J. [1 ]
Boulanger, Jonathan P. [1 ]
LaPierre, Ray R. [1 ]
机构
[1] McMaster Univ, Dept Engn Phys, Hamilton, ON L8S 4L8, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
MBE GROWTH; GALLIUM; LAYER;
D O I
10.1088/0268-1242/28/10/105025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Periodic arrays of self-catalyzed GaAs nanowires (NWs) were grown on Si substrates by gas source molecular beam epitaxy (GS-MBE) using patterned oxide templates. The various challenges of the patterning process that result in undesired outcomes are described, such as pattern transfer by wet/dry etching, oxide thickness variations, and native oxide re-growth. Transmission electron microscopy (TEM) results are used to illustrate each case. In particular, we show that a linearly increasing length-radius distribution, analogous to that observed for unpatterned self-catalyzed growth on substrates with thin oxides, may be obtained even when using patterned oxide masks due to an unintended residual layer of oxide, as confirmed by TEM analysis. We explain how a linear length-radius dependence can result from the individual NWs beginning their growth at different times, accompanied by significant radial growth. The spread in obtained NW dimensions was decreased by improving the patterning method.
引用
收藏
页数:9
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