Study of Re Coating Deposited on C/C Substrate by Double-Glow Plasma

被引：0

作者：

Hua Yunfeng ^{[1
]}

Li Zhengxian ^{[1
]}

Huang Chunliang ^{[1
]}

Du Jihong ^{[1
]}

Luo Ruixue ^{[1
]}

机构：

[1] NW Inst Nonferrous Met Res, Ctr Corros & Protect, Xian 710016, Peoples R China

来源：

RARE METAL MATERIALS AND ENGINEERING | 2012年 / 41卷 / 11期

关键词：

double-glow plasma; Re coating; C/C substrates; microstructure; interfacial bonding strength; TUNGSTEN; RHENIUM; GRAPHITE; OXIDE;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The Re coating was deposited on C/C substrates by double-glow plasma technique. The microstructure, phases, Vickers hardness and interfacial bonding strength of the coating were studied. The results show that the Re coating is composed of poly-crystalline column structural grains with preferential growth orientation of (110) and (103) crystal plane. The Re coating is dense and smooth, and the size of grains ranges from 0.5 mu m to 1.5 mu m. The Vickers hardness of the Re coating is 6.66 +/- 0.25 GPa. The Re coating and C/C substrates inter-diffuses with each other during preparation and there is mechanical bonding and physical bonding in the interface. During the loading process of the scratch tests, the interfacial bonding strength between Re coating and C/C substrates is high even when the C/C substrate is broken due to the low hardness and ductility.

引用

页码：2013 / 2016

页数：4

共 17 条

[11] MOVCHAN BA, 1969, PHYS METALS METALLOG, V28, P83
[12] Thickness-dependent properties of sprayed iridium oxide thin films
Patil, PS
Chigare, PS
Sadale, SB
Seth, T
Amalnerkar, DP
Kawar, RK
[J]. MATERIALS CHEMISTRY AND PHYSICS, 2003, 80 (03) : 667 - 675
[13] SHERMAN AJ, 1991, JOM-J MIN MET MAT S, V43, P20
[14] High-temperature properties of joint interface of VPS-tungsten coated CFC
Tamura, S
Liu, X
Tokunaga, K
Tsunekawa, Y
Okumiya, M
Noda, N
Yoshida, N
[J]. JOURNAL OF NUCLEAR MATERIALS, 2004, 329 : 711 - 716
[15] TUFFIAS RH, 1999, Patent No. 5855828
[16] Wang Haizhe, 2005, STUDY PERFORMANCE TE
[17] Diffusion analysis of rhenium in graphite using Rutherford Backscattering Spectroscopy
Zee, RH
Li, JL
[J]. DIFFUSIONS IN MATERIALS: DIMAT2000, PTS 1 & 2, 2001, 194-1 : 85 - 90

← 1 2 →