Real time fabric defect detection system on an embedded DSP platform

被引：35
|
作者：
Raheja, Jagdish Lal [1 ]
Ajay, Bandla [2 ]
Chaudhary, Ankit [3 ]
机构：
[1] CEERI CSIR, Machine Vis Lab, Pilani, Rajasthan, India
[2] BITS, Dept Elect & Elect Engn, Pilani, Rajasthan, India
[3] Univ Iowa, Dept Elect & Comp Engn, Iowa City, IA 52242 USA
来源：
OPTIK | 2013年 / 124卷 / 21期
关键词：
Fabric defects; Texture; Gray level co-occurrence matrix; DSP kit; Energy computation; Sliding window; FDDS;
D O I：
10.1016/j.ijleo.2013.03.038
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In industrial fabric productions, automated real time systems are needed to find out the minor defects. It will save the cost by not transporting defected products and also would help in making company image of quality fabrics by sending out only undefected products. A real time fabric defect detection system (FDDS), implemented on an embedded DSP platform is presented here. Textural features of fabric image are extracted based on gray level co-occurrence matrix (GLCM). A sliding window technique is used for defect detection where window moves over the whole image computing a textural energy from the GLCM of the fabric image. The energy values are compared to a reference and the deviations beyond a threshold are reported as defects and also visually represented by a window. The implementation is carried out on a TI TMS320DM642 platform and programmed using code composer studio software. The real time output of this implementation was shown on a monitor. (C) 2013 Elsevier GmbH. All rights reserved.
引用
收藏
页码：5280 / 5284
页数：5
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