DIGITAL RADIO TEST SET ADDRESSES LTE TEST CHALLENGES

被引：0
|
作者：
不详
机构：
来源：
MICROWAVE JOURNAL | 2009年 / 52卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：114 / 115
页数：2
相关论文
共 50 条
  • [41] GROWING INDUSTRY ADDRESSES SPECIALIZED TEST REQUIREMENTS.
    Anon
    Evaluation Engineering, 1986, 25 (06): : 97 - 98
  • [42] Nanometer technology challenges for test and test equipment
    Needham, WM
    COMPUTER, 1999, 32 (11) : 52 - +
  • [43] NEW TEST CHALLENGES IN VLSI TEST WORKSHOP
    RADCLIFFE, WE
    IEEE DESIGN & TEST OF COMPUTERS, 1986, 3 (06): : 55 - 56
  • [44] Walk test simulator for LTE/LTE-A network planning
    Castro-Hernandez, Diego
    Paranjape, Raman
    2016 17TH INTERNATIONAL TELECOMMUNICATIONS NETWORK STRATEGY AND PLANNING SYMPOSIUM (NETWORKS), 2016, : 56 - 61
  • [45] SOC test scheduling with test set sharing and broadcasting
    Larsson, A
    Larsson, E
    Eles, P
    Peng, Z
    14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 162 - 167
  • [46] Do not adjust your set: the benefits and challenges of test-enhanced learning
    Cantillon, Peter
    MEDICAL EDUCATION, 2008, 42 (10) : 954 - 956
  • [47] TEST IN CIRCUIT .2. THE DIGITAL TEST
    DEVOS, MR
    ONDE ELECTRIQUE, 1982, 62 (6-7): : 21 - 27
  • [48] Nondenominational digital test programming for functional test
    Sacher, E
    Lonngren, D
    AUTOTESTCON 2003, PROCEEDINGS: FUTURE SUSTAINMENT FOR MILITARY AND AEROSPACE, 2003, : 202 - 207
  • [49] Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC
    Kerzerho, V.
    Cauvet, P.
    Bernard, S.
    Azais, F.
    Comte, M.
    Renovell, M.
    IET COMPUTERS AND DIGITAL TECHNIQUES, 2007, 1 (03): : 146 - 153
  • [50] Challenges of managing test
    Harris, JL
    INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, : 1162 - 1162
12345